Controlled spalling-based mechanical substrate exfoliation for III-V solar cells: A review

J Chen, CE Packard - Solar Energy Materials and Solar Cells, 2021 - Elsevier
Controlled spalling is a fast process that can mechanically exfoliate III-V semiconductor
layers from their host wafer substrates and has the potential to produce high power-density …

Topical review: pathways toward cost-effective single-junction III–V solar cells

V Raj, T Haggren, WW Wong, HH Tan… - Journal of Physics D …, 2021 - iopscience.iop.org
III–V semiconductors such as InP and GaAs are direct bandgap semiconductors with
significantly higher absorption compared to silicon. The high absorption allows for the …

Surface micromorphology and nanostructures evolution in hybrid laser processes of slicing and polishing single crystal 4H-SiC

Y Li, Z Zhang, Q Song, H Shi, Y Hou, S Yue… - Journal of Materials …, 2024 - Elsevier
Slicing and post-treatment of SiC crystals have been a significant challenge in the integrated
circuit and microelectronics industry. To compete with wire-sawing and mechanical grinding …

CW laser-assisted splitting of SiC wafer based on modified layer by picosecond laser

L Jiang, S Zhao, S Han, H Liang, J Du, H Yu… - Optics & Laser …, 2024 - Elsevier
Silicon carbide (SiC), the third-generation semiconductor material, is important in
developing electronic power devices. Compared to wire sawing technology, Laser splitting …

Fabrication of Crystalline Si Thin Films for Photovoltaics

J An, Y Shen, P Roca i Cabarrocas… - physica status solidi …, 2022 - Wiley Online Library
Crystalline Si (c‐Si) thin films have been widely studied for their application to solar cells
and flexible electronics. However, their application at large scale is limited by their …

Freestanding and supported processing of sub-70 μm kerfless epitaxial Si and thinned Cz/FZ Si foils into solar cells: An overview of recent progress and challenges

HS Radhakrishnan, J Cho, T Bearda, J Roeth… - Solar Energy Materials …, 2019 - Elsevier
Utilisation of expensive silicon (Si) material in crystalline Si modules has come down to 4 g
Si per watt-peak in 2018, mainly as a result of reduction in wafer thickness and kerf losses …

Analysis of crystalline defects caused by growth on partially planarized spalled (100) GaAs substrates

JT Boyer, AK Braun, KL Schulte, J Simon, SW Johnston… - Crystals, 2023 - mdpi.com
We analyze the effect of growth on non-(100) surfaces resulting from incomplete
planarization of spalled GaAs wafers on the defect structure of GaAs solar cell layers grown …

Cold split kerf-free wafering results for doped 4H-SiC boules

M Swoboda, R Rieske, C Beyer, A Ullrich… - Materials Science …, 2019 - Trans Tech Publ
We report on the results of intense third party evaluation of the COLD SPLIT technology. In
total nine different SiC manufactures supplied test material. The results confirm the …

Dynamics of Crack Propagation during Silicon Spalling

PG Coll, R Meier, M Bertoni - … )(A Joint Conference of 45th IEEE …, 2018 - ieeexplore.ieee.org
Spalling has been proposed as a promising kerfless technique for slicing thin silicon wafers
and thus double the yield of a silicon ingot. The main challenge of spalling is to control the …

Sound Assisted Low Temperature Spalling: Upscaling and Throughput

M Bertoni - 2023 - osti.gov
In evaluating the state-of-the-art spalling techniques, the key factor that is missing is the
control of crack propagation, which is responsible for low quality wafers due to high surface …