[图书][B] Nanoelectronics: Quantum engineering of low-dimensional nanoensembles

VK Arora - 2018 - taylorfrancis.com
Brings the Band Structure of Carbon-Based Devices into the Limelight A shift to carbon is
positioning biology as a process of synthesis in mainstream engineering. Silicon is quickly …

The drain velocity overshoot in an 80 nm metal-oxide-semiconductor field-effect transistor

MLP Tan, VK Arora, I Saad, M Taghi Ahmadi… - Journal of Applied …, 2009 - pubs.aip.org
The current at the onset of saturation in a metal-oxide-semiconductor field-effect transistor
(MOSFET) is shown to be limited by the drain velocity that increases toward its saturation …

[PDF][PDF] Effect of threshold voltage And channel length on drain current of Silicon N-MOSFET

ASM Bakibillah, N Rahman - European Scientific Journal, 2015 - Citeseer
This paper investigates the effect of threshold voltage on drain current for different channel
lengths and analyses the impact of short channel on threshold voltage for Silicon n-MOS at …

Investigation of a novel 5nm top bottom gated junctionless FinFET for improved switching and analog performance

L Gangwani, R Chakravarti… - Journal of Physics …, 2021 - iopscience.iop.org
In this work, we have designed a Novel Top-Bottom Gated Junctionless (JL) Fin-Shaped
Field Effect Transistor (FinFET) Structure. The main idea of designing this structure is to …

Lower Fin Modulation Analysis for a Novel 5nm Top Bottom Gated Junctionless FinFET for improved performance

L Gangwani, R Chakravarti… - 2021 Devices for …, 2021 - ieeexplore.ieee.org
In this paper, lower fin modulation is performed for a Novel 5nm Top Bottom Gated
Junctionless Fin shaped Field Effect Transistor (FinFET). The analysis is done for fin lengths …

Scattering-limited and ballistic transport in a nano-CMOS circuit

I Saad, MLP Tan, ACE Lee, R Ismail, VK Arora - Microelectronics journal, 2009 - Elsevier
The mobility and saturation velocity in the nanoscale metal oxide semiconductor field effect
transistor (MOSFET) are revealed to be ballistic; the former in a channel whose length is …

Unified current modeling in low‐dimensional MOSFETs

A Lakhlef, A Benfdila, M Goudjil… - International Journal of …, 2014 - Wiley Online Library
The present paper deals with the modeling of low‐dimensional transistors in the form of
metal–oxide–semiconductor field‐effect transistors aiming a compact model that may be …

Temperature Analysis of a Novel 5nm Stacked Oxide Top Bottom Gated Junctionless FinFET for improved switching and efficiency

L Gangwani, S Hajela - 2022 IEEE International Students' …, 2022 - ieeexplore.ieee.org
Temperature Analysis of a Novel Stacked Oxide Top Bottom Gated Junctionless Fin-shaped
Field Effect Transistor (TBG JL FinFET) is described in this research paper. This …

[PDF][PDF] A parallel distance transformation algorithm

H Embrechts, D Roose - The Sixth Distributed Memory …, 1991 - scholar.archive.org
A distance transformaZion DT) converts a: binary imeh, into an image where all backg:
ground piixeh have a value equal to the distance to the nearest foreground pixel. We …

Drain current modelling in silicon MOSFETs

A Lakhlef, A Benfdila - 2014 29th International Conference on …, 2014 - ieeexplore.ieee.org
The present paper deals with the modeling of silicon MOSFET in the variety of channel
range from submicron to nanoMOSFET aiming the study of the degradation and aging of …