We present an O(\lg\lgn)-competitive online binary search tree, improving upon the best
previous (trivial) competitive ratio of O(\lgn). This is the first major progress on Sleator and …

This study describes a static test compaction procedure that is applicable in the scenario
where (i) a large pool of tests can be generated efficiently, but (ii) test compaction that …

With more and more sophisticated low-power design techniques being applied to modern
LSI chips for aggressive functional power reduction, the risk of fault-free chips falsely failing …

As the design complexity grows dramatically in modern circuit designs, 2.5 D/3D
chip/package/board integration has become a key to beat process limitation for optimizing …

Testing for delay faults after chip manufacturing is critical to correct chip operation. Tests for
delay faults are applied using scan chains that provide access to internal memory elements …

Functional test guarantees that the circuit is tested under normal conditions, thus avoiding
any over-as well as under-test. This work is based on the use of Software-Based-Self-Test …

Functionally possible scan-based tests create functional operation conditions during their
functional capture cycles. This is important for avoiding failures that are caused by …

Functional tests are important for detecting delay faults under functional operation
conditions. Functional operation conditions can be created with a scan-based test by …

Functional broadside tests detect delay faults that can affect the correct functional operation
of the circuit without overtesting. When path selection is performed to address the number of …

Two-cycle gate-exhaustive faults provide a comprehensive model for delay defects that are
localized to gates (cells or subcircuits). However, the number of two-cycle gate-exhaustive …