Perovskite CsPbBr3 single crystal detector for alpha-particle spectroscopy

Y He, Z Liu, KM McCall, W Lin, DY Chung… - Nuclear Instruments and …, 2019 - Elsevier
Here we report the first spectroscopic alpha particle detection based on CsPbBr 3 detectors
with asymmetric contacts. The CsPbBr 3 single crystal was grown from the melt using …

Tailoring the defects and resistivity in CdZnTe single crystal via one-step annealing with CdTe compound

Z Huang, S Wu, B Chen, S Tang, Y Ma, W Liu - Vacuum, 2023 - Elsevier
Defects deteriorate the optical and electronic properties of the cadmium zinc telluride (CZT)
single crystal. However, the growth of defects, such as vacancies and precipitation, could not …

[HTML][HTML] Tuning the interlayer microstructure and residual stress of buffer-free direct bonding GaN/Si heterostructures

Y Zhou, S Zhou, S Wan, B Zou, Y Feng, R Mei… - Applied Physics …, 2023 - pubs.aip.org
The direct integration of GaN with Si can boost great potential for low-cost, large-scale, and
high-power device applications. However, it is still challengeable to directly grow GaN on Si …

Numerical and experimental investigation of CdZnTe growth by the boron oxide encapsulated vertical Bridgman method

C Stelian, D Calestani, M Velázquez… - International Journal of …, 2021 - Elsevier
Cadmium zinc telluride crystals of 4.8 cm in diameter grown by the boron oxide
encapsulated vertical Bridgman technique exhibit good structural quality with large grains …

[HTML][HTML] Microstructure evolution of CdZnTe crystals irradiated by heavy ions

L Liang, L Xu, C Qin, Y Wang, Z Qin, C Liu… - Journal of Materials …, 2024 - Elsevier
Consideration of irradiation effects is important for in-orbit operation and radiation protection
in aerospace applications. The configuration of irradiation defects and their impact on …

Interlayer investigations of GaN heterostructures integrated into silicon substrates by surface activated bonding

S Zhou, S Wan, B Zou, Y Yang, H Sun, Y Zhou, J Liang - Crystals, 2023 - mdpi.com
Thinning the buffer layer thickness between the GaN epilayer and Si substrate without
introducing large residual stress is persistently desired for GaN-on-Si devices to promote …

Cadmium telluride and cadmium zinc telluride

A Zappettini - Single Crystals of Electronic Materials, 2019 - Elsevier
CdTe and CdZnTe crystals are employed for several applications such as IR imaging, X-and
gamma ray detection, optical devices, and photovoltaics. These applications require that …

Identification of twin and nanoscale Te precipitations in CdZnTe crystals grown by vertical gradient method with HRTEM

S Wu, Z Huang, B Chen, X Liu, Y Ma, Y Huang… - Materials …, 2022 - Elsevier
CdZnTe (CZT) has attracted much attention in nuclear detection field attribute to its high
detection efficiency, high energy resolution and room-temperature operation. In this work …

Evolution of cross-sectional shapes of liquid inclusions enclosed in a crystal: Computer simulation and its application for studying interface kinetics

SI Garmashov - Journal of Crystal Growth, 2024 - Elsevier
The previously developed model of the cross-sectional stationary shape of a liquid inclusion
migrating through a non-uniformly heated crystal has been extended to the case of transient …

Investigation of dislocation migration in substrate-grade CdZnTe crystals during post-annealing

N Jia, Y Xu, R Guo, Y Gu, X Fu, Y Wang, W Jie - Journal of Crystal Growth, 2017 - Elsevier
The migration of dislocations in substrate-grade CdZnTe (CZT) single crystals during
temperature gradient annealing under Cd/Zn vapor has been investigated. The etch pit …