Although DRAM capacity and bandwidth have increased sharply by the advances in
technology and standards, its latency and energy per access have remained almost …

Aging has become a critical CMOS reliability issue in nanoscales. In general, the aging
effect is exhibited as an increase in the delay of the combinational parts and robustness …

It is shown that a compact MOSFET-aging model for circuit simulation is possible by
considering the dynamic trap-density increase, which is induced during circuit operation …

With the large-scale expansion and process shrinking of modern integrated circuits, aging
has become one of the main factors threatening circuit reliability. To evaluate the impact of …

Power dissipation of on-chip cache memories contributes a large portion of a processor's
power consumption. Therefore, power management of cache memories is crucial in modern …

Cache memories dissipate a large portion of processors' power budget. On the other hand,
due to unbalanced stress condition on their SRAMs, aging of cache memories is one of the …