Collective Mie resonances for directional on-chip nanolasers

TX Hoang, ST Ha, Z Pan, WK Phua… - Nano Letters, 2020 - ACS Publications
A highly efficient nanocavity formed by optically coupled nanostructures is achieved by
optimization of the collective Mie resonances in a one-dimensional array of semiconductor …

Focusing and imaging in microsphere-based microscopy

TX Hoang, Y Duan, X Chen, G Barbastathis - Optics express, 2015 - opg.optica.org
Microsphere-based microscopy systems have garnered lots of recent interest, mainly due to
their capacity in focusing light and imaging beyond the diffraction limit. In this paper, we …

High-performance dielectric nano-cavities for near-and mid-infrared frequency applications

TX Hoang, HS Chu, FJ García-Vidal, CE Png - Journal of Optics, 2022 - iopscience.iop.org
We present a judicious design approach for optimizing semiconductor nanocavities, starting
from single photonic atoms to build photonic molecules functioning as high-performance …

Aberration compensation in aplanatic solid immersion lens microscopy

Y Lu, T Bifano, S Ünlü, B Goldberg - Optics Express, 2013 - opg.optica.org
The imaging quality of an aplanatic SIL microscope is shown to be significantly degraded by
aberrations, especially when the samples have thicknesses that are more than a few …

Multipole and plane wave expansions of diverging and converging fields

TX Hoang, X Chen, CJR Sheppard - Optics Express, 2014 - opg.optica.org
This paper presents and compares two basis systems, spherical harmonics and plane
waves, for studying diverging and converging beams in an optical system. We show a …

[PDF][PDF] Focusing light through spherical interface for subsurface microscopy

HT XUAN - 2014 - core.ac.uk
I hereby declare that the thesis is my original work and it has been written by me in its
entirety. I have duly acknowledged all the sources of information which have been used in …

Adaptive optics wavefront compensation for solid immersion microscopy in backside imaging

Y Lu - 2014 - search.proquest.com
This dissertation concerns advances in high-resolution optical microscopy needed to detect
faults in next generation semiconductor chips. In this application, images are made through …

Focusing light for subsurface imaging

TX Hoang, X Chen - 2014 IEEE Antennas and Propagation …, 2014 - ieeexplore.ieee.org
Focusing light through a boundary between two media is a topic of interest in studying and
developing different microscopies. In this paper, we use plane wave (PW) expansions and …

[PDF][PDF] Modelling and Designing Aplanatic Solid Immersion Lens Microscope for Failure Analysis of Integrated Circuits

C RUI - 2013 - core.ac.uk
Failure analysis (FA) is a critical process in the manufacturing pipeline of integrated circuit
(IC) because of its direct impact on meeting a high level of quality and reliability …

[PDF][PDF] Publications by CJR Sheppard

A Books, BE Books - 1980 - researchgate.net
1. Sheppard CJR, Ahmed H (1972) An ultra-high vacuum scanning electron diffraction
system, Vacuum 22, 567-570. DOI: 10.1016/0042-207X (72) 90027-9 2. Howorth J, Harmer …