Peculiar properties of preferential sputtering of PbTe, SnTe, and GeTe by Ar+ ion plasma
Abstract Sputtering of PbTe, SnTe and GeTe compounds having both small and large
differences in the individual components' masses by Ar+ plasma under Secondary Neutral …
differences in the individual components' masses by Ar+ plasma under Secondary Neutral …
Transformations of micron-sized PbTe surface structures induced by low energy ions
Formation and transformation of micron-sized structures on PbTe crystal surfaces under
impact of low energy Ar+ ions is studied. New phenomena occurring due to interaction of …
impact of low energy Ar+ ions is studied. New phenomena occurring due to interaction of …
Morphology of PbTe crystal surface sputtered by argon plasma under Secondary Neutral Mass Spectrometry conditions
We have investigated morphology of the lateral surfaces of PbTe crystal samples grown from
melt by the Bridgman method sputtered by Ar+ plasma with ion energy of 50-550 eV for 5-50 …
melt by the Bridgman method sputtered by Ar+ plasma with ion energy of 50-550 eV for 5-50 …
Relative detection factor for quantification of Secondary Neutral Mass Spectrometry measurements of PbTe binary telluride
Abstract Knowledge of an exact value of the relative detection factor (RDF) is important for
correct quantification of measurements of Secondary Neutral Mass Spectrometry (SNMS). A …
correct quantification of measurements of Secondary Neutral Mass Spectrometry (SNMS). A …
Amorphisation effect in binary tellurides under low energy Ar+ ion bombardment
Amorphisation effect on the surface of SnTe and GeTe samples under low Ar+ ion energy
sputtering (160 eV) has been firstly observed. Scanning electron microscopy and Raman …
sputtering (160 eV) has been firstly observed. Scanning electron microscopy and Raman …
Formation of the Sputtered Phase of PbTe Crystals by Ar+ Plasma and Re-deposition of the Sputtered Species at Secondary Neutral Mass Spectrometry Conditions
Formation of the Pb and Te sputtered phase under exposure of the lateral surface of PbTe
crystals grown from melt by the Bridgman method by Ar+ plasma at Secondary Neutral Mass …
crystals grown from melt by the Bridgman method by Ar+ plasma at Secondary Neutral Mass …
Growth of Surface Micro-and Nanostructures During Depth Profiling of PbTe Crystals by Ar Plasma.
DM Zayachuk, VE Slynko… - Journal of Nano-& …, 2017 - search.ebscohost.com
Peculiarities of depth profiling of PbTe crystals by Ar plasma with energy of 350 eV at the
conditions of Secondary Neutral Mass Spectrometry originated from the crystal growth …
conditions of Secondary Neutral Mass Spectrometry originated from the crystal growth …
[PDF][PDF] SPUTTERING RATE OF LEAD, TIN AND GERMANIUM TELLURIDES WITH LOW ENERGY ARGON IONS
Sputtering of PbTe, SnTe, and GeTe crystal samples by low-energy Ar+ ions are
investigated, and the sputtering rate vsp of the studied compounds, as well as its …
investigated, and the sputtering rate vsp of the studied compounds, as well as its …
Analyzing of lead, tin and germanium tellurides by means of secondary neutral mass spectrometry: Features, problems and possibilities
We review, summarize and augment our recent studies on the problem of using Secondary
Neutral Mass Spectrometry method for analyzing PbTe, SnTe and GeTe binary tellurides …
Neutral Mass Spectrometry method for analyzing PbTe, SnTe and GeTe binary tellurides …
Фізика і хімія твердого тіла
ДМ Заячук, ВЄ Слинько, А Чік - pnu.edu.ua
Досліджено формування фази розпорошення та переосадження розпорошених Pb і Te
при опроміненні іонами Ar+ в умовах вторинної нейтральної масспектрометрії бічних …
при опроміненні іонами Ar+ в умовах вторинної нейтральної масспектрометрії бічних …