Crosstalk induced shoot-through in bti-stressed symmetrical & asymmetrical double-trench sic power mosfets

J Yang, S Jahdi, B Stark, O Alatise… - IEEE Open Journal …, 2022 - ieeexplore.ieee.org
In this paper, the crosstalk-induced shoot-through current and induced gate voltage of SiC
planar MOSFETs, SiC symmetrical double-trench MOSFETs and SiC asymmetrical double …

Enhancing performance of dual-gate FinFET with high-K gate dielectric materials in 5 nm technology: a simulation study

MVG Rao, N Ramanjaneyulu, B Pydi, U Soma… - … on Electrical and …, 2023 - Springer
The rapid advancement in nanoscale devices demands innovative gate dielectric materials
to replace traditional Silicon dioxide. This paper investigates the electrical behavior and …

Research of single-event burnout in 1.2-kV rated CoolSiC trench MOSFET

CH Yu, MT Bao, Y Wang, HM Guo… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
This paper presents the two-dimensional (2-D) numerical simulation results of heavy-ion
induced reverse drain current degradation and single-event burnout (SEB) in the 1.2-kV …

[PDF][PDF] Analysis of performance and reliability of sub-kV SiC and GAN cascode power electronic devices

Y Gunaydin - 2023 - researchgate.net
The energy is one of the main infrastructures for human life and industries. Therefore, many
studies have been investigated on energy resources, and especially, lots of renewable …

High-Energy Dynamic Avalanche to Failure by Incremental Source-Voltage Increase in Symmetric Double-Trench & Asymmetric Trench SiC MOSFETs

M Hosseinzadehlish, S Jahdi, X Yuan… - IEEE Open Journal …, 2024 - ieeexplore.ieee.org
The unclamped inductive switching (UIS) measurements can be categorized as “low energy”
and “high energy” avalanche. The conventional approach to these tests is to increase the …

Impact of SiC power MOSFET interface trap charges on UIS reliability under single pulse

XD Wu, Y Wang, CH Yu, X Fei, J Yang, X Li - Microelectronics Reliability, 2024 - Elsevier
In this paper, the unclamped inductive switching experimental results of a 1.2-kV rated N-
Channel conventional power metal-oxide-semiconductor field-effect transistors are …

Electrothermal Power Cycling to Failure of Discrete Planar, Symmetrical Double-Trench & Asymmetrical Trench SiC MOSFETs

J Yang, S Jahdi, R Yu, B Stark - IEEE Open Journal of Power …, 2023 - ieeexplore.ieee.org
While SiC MOSFETs are now being utilized in industry their robustness under heavy-duty
applications still remains a concern. In this paper, the results of experimental measurements …

TCAD Analysis of Single-Event Burnout Hardness for an Improved CoolSiC Trench MOSFET

DX Chen, Y Wang, YX Song… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
A 1200-V rated CoolSiC Trench MOSFET structure has excellent overall electrical
characteristics due to its unique asymmetric structure. However, it is sensitive to space …

[PDF][PDF] Analysis of Performance of SiC Bipolar Semiconductor Devices for Grid-level Converters

C Shen - 2023 - research-information.bris.ac.uk
Power semiconductor devices play a determining role in the efficiency and reliability of
power electronics applications such as High Voltage Direct Current (HVDC) transmission …

[PDF][PDF] Reliability Analysis of Planar and Symmetrical & Asymmetrical Trench Discrete SiC Power MOSFETs

J Yang - 2023 - research-information.bris.ac.uk
With the introduction of Silicon Carbide (SiC) technology, SiC power Metal-oxide Field Effect
Transistors (MOSFETs) have become a potential alternative to Silicon Insulated Gate Bipolar …