HfO2-based resistive switching memory devices for neuromorphic computing
HfO 2-based resistive switching memory (RRAM) combines several outstanding properties,
such as high scalability, fast switching speed, low power, compatibility with complementary …
such as high scalability, fast switching speed, low power, compatibility with complementary …
Bifunctional resistive switching behavior in an organolead halide perovskite based Ag/CH 3 NH 3 PbI 3− x Cl x/FTO structure
Organolead halide perovskite materials open up a new era for developing low-cost and high
efficiency solar cells due to their simple and inexpensive fabrication process, superior light …
efficiency solar cells due to their simple and inexpensive fabrication process, superior light …
A Complete Statistical Investigation of RTN in HfO2-Based RRAM in High Resistive State
FM Puglisi, L Larcher, A Padovani… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
In this paper, we investigate the random telegraph noise (RTN) in hafnium-oxide resistive
random access memories in high resistive state (HRS). The current fluctuations are …
random access memories in high resistive state (HRS). The current fluctuations are …
Random telegraph noise in resistive random access memories: Compact modeling and advanced circuit design
FM Puglisi, N Zagni, L Larcher… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
In this paper, we report about the derivation of a physics-based compact model of random
telegraph noise (RTN) in HfO 2-based resistive random access memory (RRAM) devices …
telegraph noise (RTN) in HfO 2-based resistive random access memory (RRAM) devices …
Relaxation effect in RRAM arrays: Demonstration and characteristics
In this letter, two distinct retention degradation regions, a rapid resistance relaxation effect
followed by a slow resistance loss process, were observed from high-resistance state (HRS) …
followed by a slow resistance loss process, were observed from high-resistance state (HRS) …
Stimulated ionic telegraph noise in filamentary memristive devices
Random telegraph noise is a widely investigated phenomenon affecting the reliability of the
reading operation of the class of memristive devices whose operation relies on formation …
reading operation of the class of memristive devices whose operation relies on formation …
Nano-intrinsic true random number generation: A device to data study
We present a circuit technique to extract true random numbers from carrier capture and
emission in oxide traps in the emerging redox-based resistive memory (ReRAM). This …
emission in oxide traps in the emerging redox-based resistive memory (ReRAM). This …
Spatially Controlled Generation and Probing of Random Telegraph Noise in Metal Nanocrystal Embedded HfO2 Using Defect Nanospectroscopy
Random telegraph noise (RTN) is often considered a nuisance or, more critically, a key
reliability challenge for miniaturized semiconductor devices. However, this picture is …
reliability challenge for miniaturized semiconductor devices. However, this picture is …
Guidelines for a reliable analysis of random telegraph noise in electronic devices
FM Puglisi, P Pavan - IEEE Transactions on Instrumentation …, 2016 - ieeexplore.ieee.org
In this paper, we propose new guidelines for the analysis of random telegraph noise (RTN)
in electronic devices. Starting from an in-depth understanding of RTN signal characteristics …
in electronic devices. Starting from an in-depth understanding of RTN signal characteristics …
Random telegraph noise: Measurement, data analysis, and interpretation
FM Puglisi, A Padovani, L Larcher… - 2017 IEEE 24th …, 2017 - ieeexplore.ieee.org
In this paper, we delve into one of the most relevant defects-related phenomena causing
failures in the operation of modern nanoscale electron devices, namely Random Telegraph …
failures in the operation of modern nanoscale electron devices, namely Random Telegraph …