HfO2-based resistive switching memory devices for neuromorphic computing

S Brivio, S Spiga, D Ielmini - Neuromorphic Computing and …, 2022 - iopscience.iop.org
HfO 2-based resistive switching memory (RRAM) combines several outstanding properties,
such as high scalability, fast switching speed, low power, compatibility with complementary …

Bifunctional resistive switching behavior in an organolead halide perovskite based Ag/CH 3 NH 3 PbI 3− x Cl x/FTO structure

E Yoo, M Lyu, JH Yun, C Kang, Y Choi… - Journal of Materials …, 2016 - pubs.rsc.org
Organolead halide perovskite materials open up a new era for developing low-cost and high
efficiency solar cells due to their simple and inexpensive fabrication process, superior light …

A Complete Statistical Investigation of RTN in HfO2-Based RRAM in High Resistive State

FM Puglisi, L Larcher, A Padovani… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
In this paper, we investigate the random telegraph noise (RTN) in hafnium-oxide resistive
random access memories in high resistive state (HRS). The current fluctuations are …

Random telegraph noise in resistive random access memories: Compact modeling and advanced circuit design

FM Puglisi, N Zagni, L Larcher… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
In this paper, we report about the derivation of a physics-based compact model of random
telegraph noise (RTN) in HfO 2-based resistive random access memory (RRAM) devices …

Relaxation effect in RRAM arrays: Demonstration and characteristics

C Wang, H Wu, B Gao, L Dai, N Deng… - IEEE Electron …, 2015 - ieeexplore.ieee.org
In this letter, two distinct retention degradation regions, a rapid resistance relaxation effect
followed by a slow resistance loss process, were observed from high-resistance state (HRS) …

Stimulated ionic telegraph noise in filamentary memristive devices

S Brivio, J Frascaroli, E Covi, S Spiga - Scientific reports, 2019 - nature.com
Random telegraph noise is a widely investigated phenomenon affecting the reliability of the
reading operation of the class of memristive devices whose operation relies on formation …

Nano-intrinsic true random number generation: A device to data study

J Kim, H Nili, ND Truong, T Ahmed… - … on Circuits and …, 2019 - ieeexplore.ieee.org
We present a circuit technique to extract true random numbers from carrier capture and
emission in oxide traps in the emerging redox-based resistive memory (ReRAM). This …

Spatially Controlled Generation and Probing of Random Telegraph Noise in Metal Nanocrystal Embedded HfO2 Using Defect Nanospectroscopy

A Ranjan, FM Puglisi, J Molina-Reyes… - ACS Applied …, 2022 - ACS Publications
Random telegraph noise (RTN) is often considered a nuisance or, more critically, a key
reliability challenge for miniaturized semiconductor devices. However, this picture is …

Guidelines for a reliable analysis of random telegraph noise in electronic devices

FM Puglisi, P Pavan - IEEE Transactions on Instrumentation …, 2016 - ieeexplore.ieee.org
In this paper, we propose new guidelines for the analysis of random telegraph noise (RTN)
in electronic devices. Starting from an in-depth understanding of RTN signal characteristics …

Random telegraph noise: Measurement, data analysis, and interpretation

FM Puglisi, A Padovani, L Larcher… - 2017 IEEE 24th …, 2017 - ieeexplore.ieee.org
In this paper, we delve into one of the most relevant defects-related phenomena causing
failures in the operation of modern nanoscale electron devices, namely Random Telegraph …