Semiconductor piezoresistance for microsystems

AA Barlian, WT Park, JR Mallon… - Proceedings of the …, 2009 - ieeexplore.ieee.org
Piezoresistive sensors are among the earliest micromachined silicon devices. The need for
smaller, less expensive, higher performance sensors helped drive early micromachining …

A review on the mechanisms of ultrasonic wedge-wedge bonding

Y Long, J Twiefel, J Wallaschek - Journal of materials processing …, 2017 - Elsevier
Although ultrasonic (US) wire bonding has been widely applied in microelectronic
packaging industry for decades, the bonding mechanisms are not yet well understood. This …

CMOS-based microsensors and packaging

H Baltes, O Brand - Sensors and Actuators A: Physical, 2001 - Elsevier
CMOS-based microsensors benefit from well-established fabrication technologies and the
possibility of on-chip circuitry. In these devices, added on-chip functionality can be …

Multidimensional CMOS in-plane stress sensor

J Bartholomeyczik, S Brugger, P Ruther… - IEEE Sensors …, 2005 - ieeexplore.ieee.org
This paper reports a novel multidimensional complementary metal-oxide semiconductor
(CMOS) based stress sensor. The device uses an octagonal n-well in a p-substrate and …

Low-stress thermosonic copper ball bonding

A Shah, M Mayer, YN Zhou, SJ Hong… - IEEE Transactions on …, 2009 - ieeexplore.ieee.org
Thermosonic ball bonding processes on test chips with Al metallized bonding pads are
optimized with one Au and two Cu wire types, all 25 mum diameter, obtaining average shear …

Piezo-FET stress-sensor arrays for wire-bonding characterization

M Doelle, C Peters, P Ruther… - Journal of …, 2006 - ieeexplore.ieee.org
This paper reports the design, fabrication, and characterization of a two-dimensional stress-
sensor array based on a stress-sensor element exploiting the transverse pseudo-Hall effect …

In situ ultrasonic force signals during low-temperature thermosonic copper wire bonding

A Shah, M Mayer, Y Zhou, SJ Hong, JT Moon - Microelectronic Engineering, 2008 - Elsevier
Ultrasonic in situ force signals from integrated piezo-resistive microsensors were used
previously to describe the interfacial stick-slip motion as the most important mechanism in …

Thermosonic ball bonding: friction model based on integrated microsensor measurements

J Schwizer, M Mayer, D Bolliger… - Twenty Fourth IEEE …, 1999 - ieeexplore.ieee.org
A model of friction during thermosonic ball bonding is reported. The model is based on
recent ultrasonic stress measurements during ball bonding using piezoresistive …

Failure mode and mechanism analysis for Cu wire bond on Cu/Low-k chip by wire pull test and finite-element analysis

FX Che, LC Wai, TC Chai - IEEE Transactions on Device and …, 2018 - ieeexplore.ieee.org
In this paper, failure mode and mechanism analysis on Cu wire bond and bond pad
reliability for Cu/low-k chip are investigated through wire pull test and finite-element analysis …

In situ measurement and stress evaluation for wire bonding using embedded piezoresistive stress sensors

WY Yong, X Zhang, TC Chai, A Trigg… - IEEE Transactions …, 2013 - ieeexplore.ieee.org
A ball bonding process in wire bonding generally involves impact followed by ultrasonic
(US) bonding prior to wedge bonding. During the ball bonding process, the impact force …