Defect engineering in SiC technology for high-voltage power devices

T Kimoto, H Watanabe - Applied Physics Express, 2020 - iopscience.iop.org
Major features of silicon carbide (SiC) power devices include high blocking voltage, low on-
state loss, and fast switching, compared with those of the Si counterparts. Through recent …

Material science and device physics in SiC technology for high-voltage power devices

T Kimoto - Japanese Journal of Applied Physics, 2015 - iopscience.iop.org
Power semiconductor devices are key components in power conversion systems. Silicon
carbide (SiC) has received increasing attention as a wide-bandgap semiconductor suitable …

Wide-bandgap semiconductor materials: For their full bloom

S Fujita - Japanese journal of applied physics, 2015 - iopscience.iop.org
Wide-bandgap semiconductors are expected to be applied to solid-state lighting and power
devices, supporting a future energy-saving society. While GaN-based white LEDs have …

Simultaneous improvement of efficiency and stability of inverted organic solar cell via composite hole transport layer

Q Huang, J Jing, K Zhang, Y Chen, A Song… - Journal of Materials …, 2022 - pubs.rsc.org
It is generally believed that the inverted structure is more beneficial for constructing highly
stable organic solar cells (OSCs), but the power conversion efficiency (PCE) of current …

Reduction of deep levels and improvement of carrier lifetime in n-type 4H-SiC by thermal oxidation

T Hiyoshi, T Kimoto - Applied Physics Express, 2009 - iopscience.iop.org
Significant reduction of major deep levels in n-type 4H-SiC (0001) epilayers by means of
thermal oxidation is demonstrated. By thermal oxidation of epilayers at 1150–1300 C, the …

Current status and perspectives of ultrahigh-voltage SiC power devices

T Kimoto, Y Yonezawa - Materials Science in Semiconductor Processing, 2018 - Elsevier
Recent progress in the SiC material and ultrahigh-voltage devices is reviewed. Regarding
the material issues, fast epitaxial growth of high-purity epitaxial layers and reduction of basal …

Mechanisms of growth and defect properties of epitaxial SiC

F La Via, M Camarda, A La Magna - Applied Physics Reviews, 2014 - pubs.aip.org
In the last ten years, large improvements in the epitaxial silicon carbide processes have
been made. The introduction of chloride precursors, the epitaxial growth on large area …

Short minority carrier lifetimes in highly nitrogen-doped 4H-SiC epilayers for suppression of the stacking fault formation in PiN diodes

T Tawara, T Miyazawa, M Ryo, M Miyazato… - Journal of Applied …, 2016 - pubs.aip.org
We investigated the dependency of minority carrier lifetimes on the nitrogen concentration,
temperature, and the injected carrier concentration for highly nitrogen-doped 4H-SiC …

[HTML][HTML] High power direct energy conversion by nuclear batteries

MG Spencer, T Alam - Applied Physics Reviews, 2019 - pubs.aip.org
The literature on direct conversion of radioisotope energy to electricity is reviewed.
Considerations of the choice of radioisotope, converter, and device design are discussed …

Elimination of the major deep levels in n-and p-type 4H-SiC by two-step thermal treatment

T Hiyoshi, T Kimoto - Applied Physics Express, 2009 - iopscience.iop.org
By thermal oxidation of 4H-SiC at 1150–1300 C, the Z 1/2 and EH 6/7 concentrations can be
reduced to below 1× 10 11 cm-3. By the oxidation, however, a high concentration of HK0 …