Defect engineering in SiC technology for high-voltage power devices
T Kimoto, H Watanabe - Applied Physics Express, 2020 - iopscience.iop.org
Major features of silicon carbide (SiC) power devices include high blocking voltage, low on-
state loss, and fast switching, compared with those of the Si counterparts. Through recent …
state loss, and fast switching, compared with those of the Si counterparts. Through recent …
Material science and device physics in SiC technology for high-voltage power devices
T Kimoto - Japanese Journal of Applied Physics, 2015 - iopscience.iop.org
Power semiconductor devices are key components in power conversion systems. Silicon
carbide (SiC) has received increasing attention as a wide-bandgap semiconductor suitable …
carbide (SiC) has received increasing attention as a wide-bandgap semiconductor suitable …
Wide-bandgap semiconductor materials: For their full bloom
S Fujita - Japanese journal of applied physics, 2015 - iopscience.iop.org
Wide-bandgap semiconductors are expected to be applied to solid-state lighting and power
devices, supporting a future energy-saving society. While GaN-based white LEDs have …
devices, supporting a future energy-saving society. While GaN-based white LEDs have …
Simultaneous improvement of efficiency and stability of inverted organic solar cell via composite hole transport layer
Q Huang, J Jing, K Zhang, Y Chen, A Song… - Journal of Materials …, 2022 - pubs.rsc.org
It is generally believed that the inverted structure is more beneficial for constructing highly
stable organic solar cells (OSCs), but the power conversion efficiency (PCE) of current …
stable organic solar cells (OSCs), but the power conversion efficiency (PCE) of current …
Reduction of deep levels and improvement of carrier lifetime in n-type 4H-SiC by thermal oxidation
T Hiyoshi, T Kimoto - Applied Physics Express, 2009 - iopscience.iop.org
Significant reduction of major deep levels in n-type 4H-SiC (0001) epilayers by means of
thermal oxidation is demonstrated. By thermal oxidation of epilayers at 1150–1300 C, the …
thermal oxidation is demonstrated. By thermal oxidation of epilayers at 1150–1300 C, the …
Current status and perspectives of ultrahigh-voltage SiC power devices
T Kimoto, Y Yonezawa - Materials Science in Semiconductor Processing, 2018 - Elsevier
Recent progress in the SiC material and ultrahigh-voltage devices is reviewed. Regarding
the material issues, fast epitaxial growth of high-purity epitaxial layers and reduction of basal …
the material issues, fast epitaxial growth of high-purity epitaxial layers and reduction of basal …
Mechanisms of growth and defect properties of epitaxial SiC
In the last ten years, large improvements in the epitaxial silicon carbide processes have
been made. The introduction of chloride precursors, the epitaxial growth on large area …
been made. The introduction of chloride precursors, the epitaxial growth on large area …
Short minority carrier lifetimes in highly nitrogen-doped 4H-SiC epilayers for suppression of the stacking fault formation in PiN diodes
T Tawara, T Miyazawa, M Ryo, M Miyazato… - Journal of Applied …, 2016 - pubs.aip.org
We investigated the dependency of minority carrier lifetimes on the nitrogen concentration,
temperature, and the injected carrier concentration for highly nitrogen-doped 4H-SiC …
temperature, and the injected carrier concentration for highly nitrogen-doped 4H-SiC …
[HTML][HTML] High power direct energy conversion by nuclear batteries
MG Spencer, T Alam - Applied Physics Reviews, 2019 - pubs.aip.org
The literature on direct conversion of radioisotope energy to electricity is reviewed.
Considerations of the choice of radioisotope, converter, and device design are discussed …
Considerations of the choice of radioisotope, converter, and device design are discussed …
Elimination of the major deep levels in n-and p-type 4H-SiC by two-step thermal treatment
T Hiyoshi, T Kimoto - Applied Physics Express, 2009 - iopscience.iop.org
By thermal oxidation of 4H-SiC at 1150–1300 C, the Z 1/2 and EH 6/7 concentrations can be
reduced to below 1× 10 11 cm-3. By the oxidation, however, a high concentration of HK0 …
reduced to below 1× 10 11 cm-3. By the oxidation, however, a high concentration of HK0 …