The present article gives an overview of the current state of applications of Total reflection X-
Ray Fluorescence (TXRF) spectrometry for the analytical characterization of nuclear …

Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a
high sensitive analytical technique that offers limits of detection in the femtogram range for …

Interference oscillation observed in X-ray total external reflection from thin films was
analyzed by the Fourier transform algorithm. The peak position in Fourier space was in good …

The use of synchrotron radiation (SR) as an excitation source for total reflection X-ray
fluorescence analysis (TXRF) offers several advantages over X-ray tube excitation …

Within the last 20 years, total-reflection X-ray fluorescence (TXRF) has been applied to solve
a lot of analytical problems. It turned out that TXRF gives an actual approach to …

In this work, we present the results of the first round robin test of different kinds of micro-and
nanoscaled samples for total reflection X-ray fluorescence (TXRF) analysis. Therefore …

The present paper reports significant enhancement of the detection power for total-reflection
X-ray fluorescence (TXRF). The employment of an efficient wavelength-dispersive …

Grazing emission X-ray fluorescence (GEXRF) is well suited for nondestructive elemental-
sensitive depth-profiling measurements on samples with nanometer-sized features. By …

Numerical simulations of “total reflection X-ray photoelectron spectroscopy (TRXPS)” are
presented. Monochromatized X-rays impinge on a specular sample with a glancing angle …

The principles, instrumentation and methodological aspects of several nuclear and atomic
spectrometric techniques for trace element analysis are briefly described. These techniques …