[HTML][HTML] Progress in atomic-resolution aberration corrected conventional transmission electron microscopy (CTEM)

KW Urban, J Barthel, L Houben, CL Jia, L Jin… - Progress in Materials …, 2023 - Elsevier
Transmission electron microscopy is an indispensable tool in modern materials science. It
enables the structure of materials to be studied with high spatial resolution, and thus makes …

Demonstration of a 2× 2 programmable phase plate for electrons

J Verbeeck, A Béché, K Müller-Caspary, G Guzzinati… - Ultramicroscopy, 2018 - Elsevier
First results on the experimental realisation of a 2× 2 programmable phase plate for
electrons are presented. The design consists of an array of electrostatic elements that …

[HTML][HTML] Atomic-level defect modulation and characterization methods in 2D materials

OF Ngome Okello, DH Yang, YS Chu, S Yang… - APL Materials, 2021 - pubs.aip.org
Two-dimensional (2D) materials are attracting increasing research interest owing to their
distinct tunable physical properties. Moreover, the ubiquitous defects in 2D materials offer an …

Phase plates in the transmission electron microscope: operating principles and applications

M Malac, S Hettler, M Hayashida, E Kano… - …, 2021 - academic.oup.com
In this paper, we review the current state of phase plate imaging in a transmission electron
microscope. We focus especially on the hole-free phase plate design, also referred to as the …

Advancing electron microscopy using deep learning

K Chen, AS Barnard - Journal of Physics: Materials, 2024 - iopscience.iop.org
Electron microscopy, a sub-field of microanalysis, is critical to many fields of research. The
widespread use of electron microscopy for imaging molecules and materials has had an …

[PDF][PDF] Single-particle cryo-EM: alternative schemes to improve dose efficiency

Y Zhang, PH Lu, E Rotunno, F Troiani… - Journal of …, 2021 - journals.iucr.org
Imaging of biomolecules by ionizing radiation, such as electrons, causes radiation damage
which introduces structural and compositional changes of the specimen. The total number of …

Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film

M Malac, S Hettler, M Hayashida, M Kawasaki… - Micron, 2017 - Elsevier
Detailed simulations are necessary to correctly interpret the charge polarity of electron beam
irradiated thin film patch. Relying on systematic simulations we provide guidelines and …

[HTML][HTML] Aberration-corrected transmission electron microscopy with Zernike phase plates

S Hettler, R Arenal - Ultramicroscopy, 2022 - Elsevier
We explore the possibility of applying physical phase plates (PPs) in combination with
aberration-corrected transmission electron microscopy. Phase-contrast transfer …

Comparative image simulations for phase-plate transmission electron microscopy

S Hettler, R Arenal - Ultramicroscopy, 2021 - Elsevier
Numerous physical phase plates (PP) for phase-contrast enhancement in transmission
electron microscopy (TEM) have been proposed and studied with the hole-free or Volta PP …

Characterization Techniques for Graphene Quantum Dots

N Manjubaashini, TD Thangadurai, D Nataraj… - … Quantum Dots: The …, 2024 - Springer
Various characterization techniques are employed to analyze the purity, morphological,
structural, compositional, functional group, and optical properties of graphene quantum dots …