Substantial imperfections in carbon nanotube (CNT) field-effect transistors (CNFETs) are
one key obstacle to the demonstration of large-scale CNFET circuits. In this paper, we first …

The data storage logic circuit consumes a huge amount of power in any semiconductor
memory design. Continuous scaling introduces unreliable memory read/write operations, so …

As CMOS fabrication technology continues to move deeper into nano-scale, circuit's
susceptibility to manufacturing imperfections increases, and the improvements in yield …