Single switch open-circuit fault detection for three-level npc inverter using conducted emissions signature

I Abari, M Hamouda, JBH Slama… - IECON 2018-44th …, 2018 - ieeexplore.ieee.org
This paper proposes a single switch open-circuit fault diagnosis approach for three-phase
three-level NPC inverter based on conducted emissions. The proposed approach uses a …

Machine learning and emi for mosfet aging diagnosis

CMA Taleb, JBH Slama, O Nasri… - 2023 5th Global Power …, 2023 - ieeexplore.ieee.org
MOSFETs play a key role in static power converters, where power MOSFETs operate at high
switching frequencies and are susceptible to Electromagnetic Interference (EMI) due to …

Open-switch fault detection in three-phase symmetrical cascaded multilevel inverter using conducted disturbances

I Abari, M Hamouda, JBH Slama - 2018 15th International Multi …, 2018 - ieeexplore.ieee.org
This paper proposes a fault detection approach for open-circuit faults in a seven-level
cascaded H-bridge (CHB) multilevel inverter. This method utilizes a simple three-phase …

Modelling and measurement of high‐frequency conducted electromagnetic interference in DC–DC converters

I Grobler, MN Gitau - IET Science, Measurement & Technology, 2017 - Wiley Online Library
Conducted electromagnetic compatibility (EMC) noise qualification tests are normally
carried out after a prototype has been designed, built and tested and the process is repeated …

Study on EMI analysis and inhibitory techniques for switching converter devices

WJ Yin, T Wen - Progress In Electromagnetics Research Letters, 2019 - jpier.org
Due to the high power conversion efficiency, high efficiency and energy saving, wide voltage
regulation range and light weight, switching converters are widely used in many fields such …

Impact of layout on the conducted emissions of a DC-DC converter using numerical approach

W Belloumi, A Bréard, JBH Slama… - 2018 15th International …, 2018 - ieeexplore.ieee.org
This paper presents a comparative study between different buck converter layouts in order to
show its impact on conducted disturbances. Indeed, all the stray elements, such as resistive …

Experimental investigation on the evolution of a conducted-EMI buck converter after thermal aging tests of the MOSFET

S Douzi, M Tlig, JBH Slama - Microelectronics Reliability, 2015 - Elsevier
The electrical characteristics of semiconductors and especially the power components are
sensitive to temperature variation. Therefore, the thermal behaviour takes an essential place …

Power RF N-LDMOS ageing effect on conducted electromagnetic interferences

M Tlig, JBH Slama, MA Belaid - 10th International Multi …, 2013 - ieeexplore.ieee.org
Using semiconductor components in power electronics (static converters) circuits has many
objectives: high frequency switching, high current, high voltage, increase their operating …

Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging tests

S Douzi, M Kadi, H Boulzazen, M Tlig… - Microelectronics …, 2019 - Elsevier
Increasing power density, faster switching speed and higher switching frequency force
designers to spend more time both considering the effect of Electromagnetic Interferences …

Comparative study between single-phase transformerless PV inverters in terms of conducted EMI

S Kraiem, M Hamouda… - 2016 7th International …, 2016 - ieeexplore.ieee.org
Recently there has been an increasing interest in transformerless photovoltaic (PV) inverters
because of their salient benefits such as lower cost, smaller volume as well as higher …