Diamond p-FETs using two-dimensional hole gas for high frequency and high voltage complementary circuits

H Kawarada - Journal of Physics D: Applied Physics, 2022 - iopscience.iop.org
Diamond is a wide bandgap semiconductor (bandgap: 5.5 eV). However, through impurity
doping, diamond can become a p-type or n-type semiconductor. The minimum resistivity of p …

Large-signal modelling and comparison of AlGaN/GaN HEMTs and SiC MESFETs

I Angelov, K Andersson, D Schreurs… - 2006 Asia-Pacific …, 2006 - ieeexplore.ieee.org
The Large Signal (LS) model for GaN and SiC FET devices was developed and evaluated
with DC, S, and LS measurements. Special attention was paid to improve the management …

High Output Power Density of 2DHG Diamond MOSFETs With Thick ALD-Al2O3

K Kudara, S Imanishi, A Hiraiwa… - … on Electron Devices, 2021 - ieeexplore.ieee.org
This article reports on the high operation voltage large-signal performance of two-
dimensional hole gas diamond metal-oxide semiconductor field-effect transistors …

Revealing the adhesion, stability, and electronic structure of SiC/M (M= Au, Pt) interface: A first-principles study

W Wu, Y Lu, J Xu, Y Li, C Wu, J Jiang, W Yang - Vacuum, 2023 - Elsevier
The interface bonding and electronic properties between SiC and metal are the key factors
affecting the physical transport phenomena of metal-semiconductor field-effect transistors …

A novel 4H–SiC MESFET with P-type doping zone and recessed buffer layer

H Jia, Y Zhang, S Zhu, H Wang, X Wang… - Materials Science in …, 2022 - Elsevier
Based on the double recessed 4H–SiC metal semiconductor field effect transistor (DR-
MESFET) structure, a new 4H–SiC MESFET with p-type doping zone in drain drift region and …

An SiC MESFET-based MMIC process

M Sudow, K Andersson, N Billstrom… - IEEE transactions on …, 2006 - ieeexplore.ieee.org
A monolithic microwave integrated circuit (MMIC) process based on an in-house SiC
MESFET technology has been developed. The process uses microstrip technology, and a …

An improved model for current voltage characteristics of submicron SiC MESFETs

M Riaz, MM Ahmed, U Munir - Solid-State Electronics, 2016 - Elsevier
This paper presents an improved model to simulate IV characteristics of submicron SiC
MESFETs, designed for microwave power applications. The proposed model adequately …

Transient simulation of microwave SiC MESFETs with improved trap models

H Hjelmgren, F Allerstam, K Andersson… - IEEE transactions on …, 2010 - ieeexplore.ieee.org
Measured and simulated transient characteristics of a SiC metal-semiconductor field-effect
transistor are compared. Self-heating, gate tunneling, substrate, and surface traps are taken …

Observation of a two dimensional electron gas formed in a polarization doped C-face 3C∕ 4H SiC heteropolytype junction

MVS Chandrashekhar, CI Thomas, J Lu… - Applied Physics …, 2007 - pubs.aip.org
A two dimensional electron gas (2DEG) was observed in a C-face 3 C∕ 4 H SiC
heteropolytype junction. Sheet carrier concentrations of∼ 3× 10 13 cm− 2 and Hall mobility …

A novel 4H–SiC MESFET with recessed gate and channel

SM Razavi, SH Zahiri, SE Hosseini - Superlattices and Microstructures, 2013 - Elsevier
New structures named as recessed gate and channel (RGC) silicon carbide (SiC) based
metal semiconductor field effect transistors (MESFETs) are reported in this paper, in which …