Defect engineering in SiC technology for high-voltage power devices

T Kimoto, H Watanabe - Applied Physics Express, 2020 - iopscience.iop.org
Major features of silicon carbide (SiC) power devices include high blocking voltage, low on-
state loss, and fast switching, compared with those of the Si counterparts. Through recent …

Characterization of SiO2/4H-SiC Interfaces in 4H-SiC MOSFETs: A Review

P Fiorenza, F Giannazzo, F Roccaforte - Energies, 2019 - mdpi.com
This paper gives an overview on some state-of-the-art characterization methods of SiO2/4H-
SiC interfaces in metal oxide semiconductor field effect transistors (MOSFETs). In particular …

Prospects for wide bandgap and ultrawide bandgap CMOS devices

SJ Bader, H Lee, R Chaudhuri, S Huang… - … on Electron Devices, 2020 - ieeexplore.ieee.org
Power and RF electronics applications have spurred massive investment into a range of
wide and ultrawide bandgap semiconductor devices which can switch large currents and …

Selective doping in silicon carbide power devices

F Roccaforte, P Fiorenza, M Vivona, G Greco… - Materials, 2021 - mdpi.com
Silicon carbide (SiC) is the most mature wide band-gap semiconductor and is currently
employed for the fabrication of high-efficiency power electronic devices, such as diodes and …

A Memristor‐Based Silicon Carbide for Artificial Nociceptor and Neuromorphic Computing

L Liu, J Zhao, G Cao, S Zheng… - Advanced Materials …, 2021 - Wiley Online Library
With the advancement of artificial intelligence technology, more and more biological
functions need to be imitated to complete more complex tasks and adapt to a complex …

Ion implantation doping in silicon carbide and gallium nitride electronic devices

F Roccaforte, F Giannazzo, G Greco - Micro, 2022 - mdpi.com
Wide band gap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN) are
excellent materials for the next generation of high-power and high-frequency electronic …

Polishing of diamond, SiC, GaN based on the oxidation modification of hydroxyl radical: status, challenges and strategies

D Shi, W Zhou, T Zhao - Materials Science in Semiconductor Processing, 2023 - Elsevier
As the wide band-gap semiconductor materials, single crystal diamond, SiC, GaN are the
key in semiconductor fields. Due to the high hardness, high brittleness and strong chemical …

A Charge-to-Breakdown (QBD) Approach to SiC Gate Oxide Lifetime Extraction and Modeling

P Moens, J Franchi, J Lettens… - … Devices and ICs …, 2020 - ieeexplore.ieee.org
This paper proposes a charge-to-breakdown (Q BD) approach for SiC/SiO 2 dielectric
lifetime extraction. The current through the dielectric is shown to be a combination of Fowler …

GaAs metamorphic high electron mobility transistors for future deep space-biomedical-millitary and communication system applications: A review

J Ajayan, D Nirmal, P Mohankumar, D Kuriyan… - Microelectronics …, 2019 - Elsevier
Following the introduction of metamorphic high electron mobility transistors (MHEMTs) 30
years back, there has been a rapid growth in their use in advanced MMIC (monolithic …

Mobility enhancement in heavily doped 4H-SiC (0001),(112̄0), and (11̄00) MOSFETs via an oxidation-minimizing process

K Tachiki, K Mikami, K Ito, M Kaneko… - Applied Physics …, 2022 - iopscience.iop.org
The effects of a process that minimizes oxidation of SiC on the channel mobility of heavily
doped 4H-SiC (0001),(11 bar 2 0) and (1 bar 1 00) metal-oxide-semiconductor field-effect …