High‐Temporal‐Resolution Characterization Reveals Outstanding Random Telegraph Noise and the Origin of Dielectric Breakdown in h‐BN Memristors

S Pazos, T Becker, MA Villena, W Zheng… - Advanced Functional …, 2024 - Wiley Online Library
Memristor‐based electronic memory have recently started commercialization, although its
market size is small (~ 0.5%). Multiple studies claim their potential for hardware …

Random Telegraph Noise in Metal‐Oxide Memristors for True Random Number Generators: A Materials Study

X Li, T Zanotti, T Wang, K Zhu… - Advanced Functional …, 2021 - Wiley Online Library
Some memristors with metal/insulator/metal (MIM) structure have exhibited random
telegraph noise (RTN) current signals, which makes them ideal to build true random number …

Hardware implementation of a true random number generator integrating a hexagonal boron nitride memristor with a commercial microcontroller

S Pazos, W Zheng, T Zanotti, F Aguirre, T Becker… - Nanoscale, 2023 - pubs.rsc.org
The development of the internet-of-things requires cheap, light, small and reliable true
random number generator (TRNG) circuits to encrypt the data—generated by objects or …

Comprehensive numerical modeling of filamentary RRAM devices including voltage ramp-rate and cycle-to-cycle variations

D Niraula, V Karpov - Journal of Applied Physics, 2018 - pubs.aip.org
The equilibrium ON and OFF states of resistive random access memory (RRAM) are due to
formation and destruction of a conducting filament. The laws of thermodynamics dictate that …

Thermodynamics of phase transitions and bipolar filamentary switching in resistive random-access memory

VG Karpov, D Niraula, IV Karpov, R Kotlyar - Physical Review Applied, 2017 - APS
We present a phenomenological theory of bipolar filamentary resistive random-access
memory describing the commonly observed features of their current-voltage characteristics …

Influence of oxygen ion elementary diffusion jumps on the electron current through the conductive filament in yttria stabilized zirconia nanometer-sized memristor

AV Yakimov, DO Filatov, ON Gorshkov… - Chaos, Solitons & …, 2021 - Elsevier
The structure of the electron current through an individual filament of a nanometer-sized
virtual memristor consisting of a contact of a conductive atomic force microscope probe to an …

Investigation of Filamentary Current Fluctuations Features in the High-Resistance State of Ni/HfO2-Based RRAM

MB Gonzalez, J Martin-Martinez… - … on Electron Devices, 2016 - ieeexplore.ieee.org
In this paper, the presence of filamentary current instabilities in the high resistance state of
Ni/HfO 2-based RRAM devices and their associated current fluctuations mechanisms are …

Correlation analysis between the current fluctuation characteristics and the conductive filament morphology of HfO2-based memristor

Y Li, KS Yin, MY Zhang, L Cheng, K Lu… - Applied Physics …, 2017 - pubs.aip.org
Memristors are attracting considerable interest for their prospective applications in
nonvolatile memory, neuromorphic computing, and in-memory computing. However, the …

Electrical characterization of Random Telegraph Noise in Fully-Depleted Silicon-On-Insulator MOSFETs under extended temperature range and back-bias operation

C Marquez, N Rodriguez, F Gamiz, R Ruiz… - Solid-State Electronics, 2016 - Elsevier
Abstract Random Telegraph Noise (RTN) has been studied in Ultra-Thin Fully-Depleted
Silicon-On-Insulator transistors. A modified Time Lag Plot algorithm has been used to …

Semi-automated extraction of the distribution of single defects for nMOS transistors

B Stampfer, F Schanovsky, T Grasser, M Waltl - Micromachines, 2020 - mdpi.com
Miniaturization of metal-oxide-semiconductor field effect transistors (MOSFETs) is typically
beneficial for their operating characteristics, such as switching speed and power …