Scalability of voltage-controlled filamentary and nanometallic resistance memory devices

Y Lu, JH Lee, IW Chen - Nanoscale, 2017 - pubs.rsc.org
Much effort has been devoted to device and materials engineering to realize nanoscale
resistance random access memory (RRAM) for practical applications, but a rational physical …

Nanofilament dynamics in resistance memory: Model and validation

Y Lu, JH Lee, IW Chen - ACS nano, 2015 - ACS Publications
Filamentary resistive random-access memory (ReRAM) employs a single nanoscale event
to trigger a macroscopic state change. While fundamentally it involves a gradual …

Purely electronic nanometallic resistance switching random-access memory

Y Lu, JH Yoon, Y Dong, IW Chen - MRS Bulletin, 2018 - cambridge.org
Resistance switching random-access memory (ReRAM), with the ability to repeatedly
modulate electrical resistance, has been highlighted as a feasible high-density memory with …

Resolving voltage–time dilemma using an atomic-scale lever of subpicosecond electron–phonon interaction

X Yang, I Tudosa, BJ Choi, ABK Chen, IW Chen - Nano Letters, 2014 - ACS Publications
Nanoelectronic memory based on trapped charge need to be small and fast, but
fundamentally it faces a voltage–time dilemma because the requirement of a high-energy …

Demonstration of Ultra‐Fast Switching in Nanometallic Resistive Switching Memory Devices

X Yang - Journal of Nanoscience, 2016 - Wiley Online Library
Interdependency of switching voltage and time creates a dilemma/obstacle for most resistive
switching memories, which indicates low switching voltage and ultra‐fast switching time …

Distinguishing uniform switching from filamentary switching in resistance memory using a fracture test

Y Lu, JH Lee, X Yang, IW Chen - Nanoscale, 2016 - pubs.rsc.org
Resistance random access memory (RRAM) is a rapidly developing emergent
nanotechnology. For practical applications and basic understanding, it is important to …

[HTML][HTML] Tuning resistance states by thickness control in an electroforming-free nanometallic complementary resistance random access memory

X Yang, Y Lu, J Lee, IW Chen - Applied Physics Letters, 2016 - pubs.aip.org
Tuning low resistance state is crucial for resistance random access memory (RRAM) that
aims to achieve optimal read margin and design flexibility. By back-to-back stacking two …

[图书][B] Quantum Electronic Interference in Nano Amorphous Silicon and Other Thin Film Resistance Memory

Y Lu - 2017 - search.proquest.com
This thesis describes conductivity in amorphous semiconductors and insulators—some
doped with metals, in which elastic electrons can random walk across a transport length of …

Conducting Electrons in Amorphous Si Nanostructures: Coherent Interference and Metal-Insulator Transitions Mediated by Local Structures

Y Lu, IW Chen - arXiv preprint arXiv:1703.02203, 2017 - arxiv.org
Without a periodic reference framework, local structures in noncrystalline solids are difficult
to specify, but they still exert an enormous influence on materials properties. For example …

Focus ion beam-induced mechanical stress switching in an ultra-fast resistive switching device

X Yang - Applied Physics A, 2016 - Springer
Abstract The Mo/Si 3 N 4: Pt/Pt nanometallic resistive switching devices with ultra-fast
write/erase speed (< 50 ns) were fabricated. Other than conventional electrical switching, a …