Ionizing radiation damage effects on GaN devices

SJ Pearton, F Ren, E Patrick, ME Law… - ECS Journal of solid …, 2015 - iopscience.iop.org
Gallium Nitride based high electron mobility transistors (HEMTs) are attractive for use in high
power and high frequency applications, with higher breakdown voltages and two …

Radiation damage in wide and ultra-wide bandgap semiconductors

SJ Pearton, A Aitkaliyeva, M Xian, F Ren… - ECS Journal of Solid …, 2021 - iopscience.iop.org
The wide bandgap semiconductors SiC and GaN are already commercialized as power
devices that are used in the automotive, wireless, and industrial power markets, but their …

Radiation damage in GaN/AlGaN and SiC electronic and photonic devices

SJ Pearton, X Xia, F Ren, MAJ Rasel… - Journal of Vacuum …, 2023 - pubs.aip.org
The wide bandgap semiconductors SiC and GaN are commercialized for power electronics
and for visible to UV light-emitting diodes in the case of the GaN/InGaN/AlGaN materials …

Radiation damage in the ultra-wide bandgap semiconductor Ga2O3

X Xia, JS Li, R Sharma, F Ren, MAJ Rasel… - ECS Journal of Solid …, 2022 - iopscience.iop.org
We present a review of the published experimental and simulation radiation damage results
in Ga 2 O 3. All of the polytypes of Ga 2 O 3 are expected to show similar radiation …

Effect of γ-ray irradiation on Schottky and ohmic contacts on AlGaN/GaN hetero-structures

C Sharma, AK Visvkarma, R Laishram, A Kumar… - Microelectronics …, 2020 - Elsevier
The effect of γ-ray irradiation on the electrical transport characteristics of ohmic contacts and
Schottky contacts having different dimensions on AlGaN/GaN hetero-structures has been …

Simulation study of single-event burnout in hardened GaN MISFET

XX Fei, Y Wang, B Sun, J Xing, W Wei, CY Li - Radiation Physics and …, 2023 - Elsevier
This paper presents simulation results of a single event burnout (SEB), for a hardened GaN
metal-insulator-semiconductor field-effect transistor (MISFET), employing a dual channel p …

Simulation of radiation effects in AlGaN/GaN HEMTs

EE Patrick, M Choudhury, F Ren… - ECS Journal of Solid …, 2015 - iopscience.iop.org
AlGaN/GaN high electron mobility transistors (HEMTs) are desirable for space applications
because of their relative radiation hardness. Predictive modeling of these devices is …

Modeling proton irradiation in AlGaN/GaN HEMTs: Understanding the increase of critical voltage

E Patrick, ME Law, L Liu, CV Cuervo… - … on Nuclear Science, 2013 - ieeexplore.ieee.org
A combination of TRIM and FLOODS models the effect of radiation damage on AlGaN/GaN
HEMTs. While excellent fits are obtained for threshold voltage shift, the models do not fully …

Effects of Gd2O3 Gate Dielectric on Proton-Irradiated AlGaN/GaN HEMTs

Z Gao, MF Romero, A Redondo-Cubero… - IEEE Electron …, 2017 - ieeexplore.ieee.org
AlGaN/GaN high electron mobility transistors (HEMTs) and MOS-HEMTs using Gd 2 O 3 as
gate dielectric were irradiated with 2-MeV protons up to fluence of 1× 10 15 cm-2. Results …

Effect of low dose γ-irradiation on DC performance of circular AlGaN/GaN high electron mobility transistors

YH Hwang, YL Hsieh, L Lei, S Li, F Ren… - Journal of Vacuum …, 2014 - pubs.aip.org
The changes in direct current performance of circular-shaped AlGaN/GaN high electron
mobility transistors (HEMTs) after 60 Co γ-irradiation doses of 50, 300, 450, or 700 Gy were …