Spectroscopic ellipsometry studies on microstructure evolution of a-Si: H to nc-Si: H films by H2 plasma exposure

V Kanneboina, R Madaka, P Agarwal - Materials Today Communications, 2018 - Elsevier
This paper presents the influence of hydrogen plasma treatment on the growth of nano
crystalline silicon phase in a-SiH films. Series of hydrogenated amorphous silicon films were …

Precise morphology control of in-plane silicon nanowires via a simple plasma pre-treatment

Z Xue, W Chen, X Meng, J Xu, Y Shi, K Chen, L Yu… - Applied Surface …, 2022 - Elsevier
Silicon nanowires (SiNWs) are advantageous building blocks to explore a wide range of
high performance nanoelectronics and photonics devices. In-plane solid-liquid-solid (IPSLS) …

Ultra-thin crystalline silicon films produced by plasma assisted epitaxial growth on silicon wafers and their transfer to foreign substrates

M Moreno, PR i Cabarrocas - EPJ Photovoltaics, 2010 - epj-pv.org
We have developed a new process to produce ultra-thin crystalline silicon films with
thicknesses in the range of 0.1− 1 μm on flexible substrates. A crystalline silicon wafer was …

Ellipsometry investigation of the amorphous-to-microcrystalline transition in a-Si: H under hydrogen-plasma treatment

A Hadjadj, N Pham, P Roca i Cabarrocas… - Journal of Applied …, 2010 - pubs.aip.org
We have investigated by ellipsometry the structural evolution of intrinsic and doped
hydrogenated amorphous silicon (a-Si: H) thin films during their exposure to a hydrogen …

Hydrogen related crystallization in intrinsic hydrogenated amorphous silicon films prepared by reactive radiofrequency magnetron sputtering at low temperature

D Senouci, R Baghdad, A Belfedal, L Chahed, X Portier… - Thin Solid Films, 2012 - Elsevier
We present an investigation on the transition from amorphous to nanocrystalline silicon and
associated hydrogen changes during the first steps of hydrogenated nanocrystalline silicon …

Optical and structural properties of hydrogenated silicon films prepared by rf-magnetron sputtering at low growth temperatures: Study as function of argon gas dilution

Y Bouizem, K Kefif, JD Sib, D Benlakehal… - Journal of non …, 2012 - Elsevier
Two series of hydrogenated silicon thin films were deposited by the rf-magnetron sputtering
(RFMS) at relatively low growth temperatures (Ts= 100° C), in order to use the new …

Effect of light-soaking on the hydrogen effusion mechanisms in polymorphous silicon thin film structures

L Hamui, BM Monroy, PR i Cabarrocas… - Materials Chemistry and …, 2015 - Elsevier
This work describes a study performed on hydrogenated polymorphous silicon PIN and NIP
structures, deposited by plasma enhanced chemical vapor deposition (PECVD). We study …

Optoelectronic Properties Improvement of pm-Si: H Films with Silane Flux Variation

L Hamui, G Santana - 2018 IEEE 7th World Conference on …, 2018 - ieeexplore.ieee.org
this work describes the effect of silane flux on pm-Si: H films deposited by pecvd, with 3.5
torr, 210° C and silane flux between 16-40 sccm. The augment of the silane flux increase the …

New Findings of Thermal Effect on pm-Si: H Solar Cells Optoelectronic Properties

L Hamui, LA Górnez-González… - 2017 IEEE 44th …, 2017 - ieeexplore.ieee.org
This work describes the effect of temperature on pm-Si: H PIN and NIP structures deposited
by PECVD. Temperature dependent measurements were conducted to understand …

Study of prolonged light-soaking (∼ 400 Hrs) effect on Pm-Si: H solar cell structures

L Hamui, BM Monroy, G Santana… - 2015 IEEE 42nd …, 2015 - ieeexplore.ieee.org
Different pm-Si: H structures were grown using PECVD technique in order to study the effect
of light exposition on solar cell structures based on these materials. PIN and NIP structures …