The focused ion beam (FIB) is a powerful tool for fabrication, modification, and
characterization of materials down to the nanoscale. Starting with the gallium FIB, which was …

VDM Alloy 780 is a new nickel-based superalloy developed for higher service temperatures
up to 750° C. In addition to fine γ′-Ni 3 (Al, Ti) strengthening precipitates, grain boundary …

In this work, an image analysis procedure which enables an estimation of grain size
distribution from optical and scanning electron micrographs is detailed. Two applicative …

A new method has been developed for the correction of the distortions and/or enhanced
phase differentiation in Electron Backscatter Diffraction (EBSD) data. Using a multi-modal …

In this study, an innovative strategy of dislocation configuration and texture optimization is
employed to achieve a heterogeneous dynamic-recovered (DRV) high-manganese steel via …

We present a proof-of-concept attesting the feasability to obtain orientation maps of
polycrystalline materials within a conventional Scanning Electron Microscope (SEM) using a …

The interpretation of helium ion microscopy (HIM) images of crystalline metal clusters
requires microscopic understanding of the effects of He ion irradiation on the system …

The dislocation structure of copper single crystal during cyclic fatigue has been
characterized by the Rotational-Electron Channeling Contrast Imaging (R-ECCI) method …

This thesis, a collaboration between CEMES-CNRS, Satie laboratory (ENS Cachan) and
NXP Semiconductors is motivated by the comprehension of the failure mechanisms of low …

Because they exhibit very similar diffraction patterns, the γ and γ′ phases of nickel-based
superalloys cannot be distinguished by the conventional EBSD technique alone. This paper …