Deep learning modeling in microscopy imaging: A review of materials science applications

M Ragone, R Shahabazian-Yassar, F Mashayek… - Progress in Materials …, 2023 - Elsevier
The accurate analysis of microscopy images representing various materials obtained in
scanning probe microscopy, scanning tunneling microscopy, and transmission electron …

Advanced electron microscopy for advanced materials

G Van Tendeloo, S Bals, S Van Aert… - Advanced …, 2012 - Wiley Online Library
The idea of this Review is to introduce newly developed possibilities of advanced electron
microscopy to the materials science community. Over the last decade, electron microscopy …

Negative mixing enthalpy solid solutions deliver high strength and ductility

Z An, A Li, S Mao, T Yang, L Zhu, R Wang, Z Wu… - Nature, 2024 - nature.com
Body-centred cubic refractory multi-principal element alloys (MPEAs), with several refractory
metal elements as constituents and featuring a yield strength greater than one gigapascal …

Dr. Probe: A software for high-resolution STEM image simulation

J Barthel - Ultramicroscopy, 2018 - Elsevier
Abstract The Dr. Probe software for multislice simulations of STEM images is introduced, and
reference is given of the applied methods. Major program features available with the …

StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

A De Backer, KHW Van den Bos, W Van den Broek… - Ultramicroscopy, 2016 - Elsevier
An efficient model-based estimation algorithm is introduced to quantify the atomic column
positions and intensities from atomic resolution (scanning) transmission electron microscopy …

Entropy-limited topological protection of skyrmions

J Wild, TNG Meier, S Pöllath, M Kronseder, A Bauer… - Science …, 2017 - science.org
Magnetic skyrmions are topologically protected whirls that decay through singular magnetic
configurations known as Bloch points. We used Lorentz transmission electron microscopy to …

Composition mapping in InGaN by scanning transmission electron microscopy

A Rosenauer, T Mehrtens, K Müller, K Gries… - Ultramicroscopy, 2011 - Elsevier
We suggest a method for chemical mapping that is based on scanning transmission electron
microscopy (STEM) imaging with a high-angle annular dark field (HAADF) detector. The …

Procedure to count atoms with trustworthy single-atom sensitivity

S Van Aert, A De Backer, GT Martinez, B Goris… - Physical Review B …, 2013 - APS
We report a method to reliably count the number of atoms from high-angle annular dark field
scanning transmission electron microscopy images. A model-based analysis of the …

2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy

H Tan, S Turner, E Yücelen, J Verbeeck… - Physical review …, 2011 - APS
Using a combination of high-angle annular dark-field scanning transmission electron
microscopy and atomically resolved electron energy-loss spectroscopy in an aberration …

Quantitative elemental mapping at atomic resolution using X-ray spectroscopy

G Kothleitner, MJ Neish, NR Lugg, SD Findlay… - Physical Review Letters, 2014 - APS
Elemental mapping using energy-dispersive x-ray spectroscopy in scanning transmission
electron microscopy, a well-established technique for precision elemental concentration …