Recent Developments in Understanding the Gate Switching Instability in Silicon Carbide MOSFETs
Silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (MOSFETs) are
becoming increasingly important in numerous renewable energy applications that inherently …
becoming increasingly important in numerous renewable energy applications that inherently …
Gate switching instability in silicon carbide MOSFETs—Part I: Experimental
In the context of renewable energy generation, compact and efficient electric power
conversion is becoming increasingly important. Due to their low-loss switching capability at …
conversion is becoming increasingly important. Due to their low-loss switching capability at …
Assessing, controlling and understanding parameter variations of SiC power MOSFETs in switching operation
T Aichinger, MW Feil, P Salmen - Key Engineering Materials, 2023 - Trans Tech Publ
Semiconductor manufacturers and researchers have recently revealed that under specific
bipolar gate switching conditions SiC MOSFETs exhibit parameter drift dynamics different …
bipolar gate switching conditions SiC MOSFETs exhibit parameter drift dynamics different …
Temperature-dependent electroluminescence of a gate pulsed silicon carbide metal–oxide–semiconductor field-effect transistor: Insight into interface traps
Switching a silicon carbide (SiC) metal–oxide–semiconductor field-effect transistor between
inversion and accumulation with removed drain and grounded source terminals leads to …
inversion and accumulation with removed drain and grounded source terminals leads to …
Electroluminescence Spectra of a Gate Switched MOSFET at Cryogenic and Room Temperatures Agree with Ab Initio Calculations of 4H-SiC/SiO2-Interface Defects
To reach the theoretical performance limit of 4HSiCMOSFETs the SiC/SiO2interfacedefects
along the inversion channel need to be fully identified in order to be avoided. We employa …
along the inversion channel need to be fully identified in order to be avoided. We employa …
Time-gated optical spectroscopy of field-effect-stimulated recombination via interfacial point defects in fully processed silicon carbide power MOSFETs
Fully processed SiC power MOSFETs emit light during switching of the gate terminal, while
the drain and source terminals are both grounded. The emitted photons are caused by …
the drain and source terminals are both grounded. The emitted photons are caused by …
Exploring the border traps near the SiO2-SiC interface using conductance measurements
P Kumar, M Krummenacher… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
The high density of interface and border traps is responsible for the reduced mobility and
threshold voltage instabilities in state-of-the-art SiC power devices. In this work, we have …
threshold voltage instabilities in state-of-the-art SiC power devices. In this work, we have …
[HTML][HTML] Photon-assisted electron depopulation of 4H-SiC/SiO2 interface states in n-channel 4H-SiC metal–oxide–semiconductor field effect transistors
M Weger, J Kuegler, M Nelhiebel, M Moser… - Journal of Applied …, 2024 - pubs.aip.org
4H-SiC/SiO 2 interface states play a major role in the performance and reliability of modern
4H-SiC metal–oxide–semiconductor field effect transistors (MOSFETs). To gain new insights …
4H-SiC metal–oxide–semiconductor field effect transistors (MOSFETs). To gain new insights …
Emission of Trapped Electrons from the 4H-SiC/SiO2-Interface via Photon-Irradiance at Cryogenic Temperatures
M Weger, M Bockstedte, G Pobegen - Defect and Diffusion Forum, 2024 - Trans Tech Publ
For a reliable MOSFET performance it is crucial to identify and reduce device performance
limiting 4H-SiC/SiO2 interface defects. Previous studies have focused on the quantification …
limiting 4H-SiC/SiO2 interface defects. Previous studies have focused on the quantification …
[PDF][PDF] The Editorial Board and Editorial Team are delighted to present a selection of short Research Highlights describing some of our favourite Communications …
M Feil - scienceopen.com
As 2023 draws to a close, we highlight some of the great stories of engineering insight and
solutions that we have published over the year. The final selection covers topics from across …
solutions that we have published over the year. The final selection covers topics from across …