Compositionally graded III-nitride alloys: Building blocks for efficient ultraviolet optoelectronics and power electronics

H Zhang, C Huang, K Song, H Yu, C Xing… - Reports on Progress …, 2021 - iopscience.iop.org
Wide bandgap aluminum gallium nitride (AlGaN) semiconductor alloys have established
themselves as the key materials for building ultraviolet (UV) optoelectronic and power …

GaN-based power high-electron-mobility transistors on Si substrates: from materials to devices

N Wu, Z Xing, S Li, L Luo, F Zeng… - … Science and Technology, 2023 - iopscience.iop.org
Conventional silicon (Si)-based power devices face physical limitations—such as switching
speed and energy efficiency—which can make it difficult to meet the increasing demand for …

Atomic layer etching technique for InAlN/GaN heterostructure with AlN etch-stop layer

F Du, Y Jiang, Z Qiao, Z Wu, C Tang, J He… - Materials Science in …, 2022 - Elsevier
An atomic layer etching (ALE) technique for InAlN/AlN/GaN structure was investigated for the
first time. Different recipes with O 2 modification times of 30–180 s and BCl 3 removal RF …

MOVPE growth conditions optimization for AlGaN/GaN/Si heterostructures with SiN and LT-AlN interlayers designed for HEMT applications

M Wośko, T Szymański, B Paszkiewicz… - Journal of Materials …, 2019 - Springer
In this work we present the influence of in situ deposited non-continous SiN layer and the
chemical precursors III/V mole ratio change during GaN buffer growth for AlGaN/GaN/Si …

Enhancement-mode tri-gate nanowire InAlN/GaN MOSHEMT for power applications

YP Huang, WC Hsu, HY Liu… - IEEE Electron Device …, 2019 - ieeexplore.ieee.org
This letter demonstrates a novel enhancement-mode (E-mode) tri-gate nanowire InAlN/GaN
MOSHEMT with ultrasonic spray pyrolysis deposition (USPD) deposited Al 2 O 3 as the gate …

Record-low contact resistance for InAlN/AlN/GaN high electron mobility transistors on Si with non-gold metal

S Arulkumaran, GI Ng, K Ranjan… - Japanese Journal of …, 2015 - iopscience.iop.org
Abstract We have demonstrated 0.17-µm gate-length In 0.17 Al 0.83 N/GaN high-electron-
mobility transistors (HEMTs) on Si (111) substrates using a non-gold metal stack …

Growth of AlInN film on GaAs substrate and its application to MSM UV photodetector

N Afzal, M Devarajan, K Ibrahim - Materials Research Express, 2016 - iopscience.iop.org
AlInN film was grown on n-type GaAs (100) substrate by using reactive magnetron co-
sputtering technique at 100 C. The structural analysis revealed polycrystalline nature of the …

Influence of substrate temperature on the growth and properties of reactively sputtered In-rich InAlN films

N Afzal, M Devarajan, K Ibrahim - Journal of Materials Science: Materials …, 2016 - Springer
Indium-rich InAlN films were prepared on Si (111) substrates by using reactive co-sputtering
in a mixed Ar-N 2 atmosphere. The substrate temperature was varied from room temperature …

Enhancement-mode InAlN/GaN power MOSHEMT on silicon with Schottky tri-drain extension

YP Huang, CS Lee, WC Hsu - IEEE Electron Device Letters, 2020 - ieeexplore.ieee.org
This study demonstrates an enhancement-mode (E-mode) InAlN/GaN MOSHEMT on a
silicon substrate with a Schottky tri-drain extension (STDE) to yield a large breakdown …

MOCVD growth of InP-based 1.3 μm quantum dash lasers on (001) Si

W Luo, Y Xue, B Shi, S Zhu, X Dong, KM Lau - Applied Physics Letters, 2020 - pubs.aip.org
Quantum dot and quantum dash (QDash) lasers exhibit lower threshold, less temperature
sensitivity, and larger modulation bandwidths than the conventional quantum well lasers …