I have tried to explain that each of the mass analyzers discussed has specific merits and
limitations. The picture present in your mind depends on the side from which you look (Fig …

High-resolution SIMS analysis can be used to explore a wide range of problems in material
science and engineering materials, especially when chemical imaging with good spatial …

Grain boundaries are important structural components of polycrystalline materials used in
the vast majority of technical applications. Because grain boundaries form a continuous …

Abstract The Monte Carlo Program TRIM. SP (sputtering version of TRIM) was used to
determine sputtering yields and energy and angular distributions of sputtered particles in …

Multivariate image analysis (MIA) is a methodology for analyzing multivariate images, where
the image coordinates are position (two‐or three‐dimensions) and variable number …

This completely revised second edition of the standard work has been expanded by some
twenty percent to include more information on the latest developments and new apparatus …

We describe a new secondary ion mass spectrometry technique for compositional analysis
of matrix elements. It consists of detecting the molecular ions CsM+ rather than M±ions (M is …

An alkaline etched, superhydrophilic aluminum surface was modified using functionalized
alkyl compounds selected to study the effect of their properties on adsorption on the metal …

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful chemical
characterization technique allowing for the distribution of all material components (including …

Ionization of neutral atoms sputtered from ion bombarded solids by multiphoton resonance
ionization has been demonstrated for the first time. The ionization efficiency is several orders …