Atomic force microscopy is an amazing technique that allies a versatile methodology (that
allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented …

Electron tunneling through atomically flat and ultrathin hexagonal boron nitride (h-BN) on
gold-coated mica was investigated using conductive atomic force microscopy. Low-bias …

The remarkable development of organic thin film transistors (OTFTs) has led to their
emerging use in active matrix flat-panel displays, radio frequency identification cards, and …

A conductive tip in an atomic force microscope (AFM) has extended the capability from
conventional topographic imaging to electrical surface characterization. The conductive tip …

Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well
established techniques to image surfaces and to probe material properties at the atomic and …

Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

We report on the integration of atomically thin 2D insulating hexagonal boron nitride (h-BN)
tunnel barriers into Co/h-BN/Fe magnetic tunnel junctions (MTJs). The h-BN monolayer is …

We report the interlayer screening effects of ultrathin MoS 2 nanoflakes with different
thicknesses by measuring their surface potential using Kelvin probe microscope. Surface …

We report on efficient carrier-to-exciton conversion and planar electroluminescence from
tunnel diodes based on a metal–insulator–semiconductor (MIS) van der Waals heterostack …

Electrical conductivity measurements were performed on single apoferritin and holoferritin
molecules by conductive atomic force microscopy. Conductivity of self-assembled …