Silicon nitride and hydrogenated silicon nitride thin films: A review of fabrication methods and applications

N Hegedüs, K Balázsi, C Balázsi - Materials, 2021 - mdpi.com
Silicon nitride (SiNx) and hydrogenated silicon nitride (SiNx: H) thin films enjoy widespread
scientific interest across multiple application fields. Exceptional combination of optical …

[图书][B] Ионно-плазменные процессы в тонкопленочной технологии

ЕВ Берлин, ЛА Сейдман - 2010 - elibrary.ru
Настоящая книга представляет собой подробное справочное руководство по основным
вакуумным плазмохимическим процессам в тонкопленочной технологии-реактивному …

Deposition of silicon nitride thin films by RF magnetron sputtering: a material and growth process study

MA Signore, A Sytchkova, D Dimaio, A Cappello… - Optical Materials, 2012 - Elsevier
Silicon nitride (SiNx) thin films were deposited by RF magnetron sputtering at room
temperature in (Ar+ N2) atmosphere by tuning the reactive gas flux percentage in the …

Atmospheric-pressure plasma-enhanced chemical vapor deposition of a-SiCN: H films: role of precursors on the film growth and properties

S Guruvenket, S Andrie, M Simon… - … Applied Materials & …, 2012 - ACS Publications
Atmospheric pressure plasma enhanced chemical vapor deposition (AP-PECVD) using
Surfx AtomflowTM 250D APPJ was utilized to synthesize amorphous silicon carbonitride …

Diffusion studies in magnetron sputter deposited silicon nitride films

J Kulczyk-Malecka, PJ Kelly, G West… - Surface and Coatings …, 2014 - Elsevier
In this work, silicon nitride coatings were deposited by magnetron sputtering onto float glass
substrates and post-deposition annealed at 650° C for 5 min. The structures and …

Tuning silicon nitride refractive index through radio-frequency sputtering power

D De Luca, E Di Gennaro, D De Maio, C D'Alessandro… - Thin Solid Films, 2021 - Elsevier
Fabrication of thin-film multilayer structures by sputtering typically requires a multi-cathode
deposition machine. This study proposes a simpler approach based on the radio-frequency …

Cavitation erosion resistance of NiTi thin films produced by Filtered Arc Deposition

LM Yang, AK Tieu, DP Dunne, SW Huang, HJ Li… - Wear, 2009 - Elsevier
In this study, NiTi thin films were obtained by using a Filtered Arc Deposition System (FADS).
X-ray diffraction (XRD), Scanning Electron Microscopy (SEM), Energy Dispersive …

Mechanical property characterization of sputtered and plasma enhanced chemical deposition (PECVD) silicon nitride films after rapid thermal annealing

PH Wu, IK Lin, HY Yan, KS Ou, KS Chen… - Sensors and Actuators A …, 2011 - Elsevier
In this paper, the mechanical and fracture properties of silicon nitride films subjected to rapid
thermal annealing (RTA) have been systemically tested. The residual stress, Young's …

[HTML][HTML] Impurity analysis of electroplated gold components with multi-layered structures by thermal desorption spectrometry toward application in gold Micro electro …

T Akiyama, T Kurioka, CY Chen, TFM Chang… - Micro and Nano …, 2023 - Elsevier
Au-based micro-electro-mechanical-system (Au-MEMS) capacitance accelerometers show
high sensitivity by suppressing the mechanical noise because of the high mass density of …

Atmospheric pressure plasma CVD of amorphous hydrogenated silicon carbonitride (a‐SiCN: H) films using triethylsilane and nitrogen

S Guruvenket, S Andrie, M Simon… - Plasma Processes …, 2011 - Wiley Online Library
Amorphous hydrogenated silicon carbonitride (a‐SiCN: H) thin films are synthesized by
atmospheric pressure plasma enhanced chemical vapor (AP‐PECVD) deposition using the …