Computer-aided design of analog and mixed-signal integrated circuits
GGE Gielen, RA Rutenbar - Proceedings of the IEEE, 2000 - ieeexplore.ieee.org
This survey presents an overview of recent advances in the state of the art for computer-
aided design (CAD) tools for analog and mixed-signal integrated circuits (ICs). Analog …
aided design (CAD) tools for analog and mixed-signal integrated circuits (ICs). Analog …
[图书][B] Principles of testing electronic systems
S Mourad, Y Zorian - 2000 - books.google.com
A pragmatic approach to testing electronic systems As we move ahead in the electronic age,
rapid changes in technology pose an ever-increasing number of challenges in testing …
rapid changes in technology pose an ever-increasing number of challenges in testing …
Analog fault coverage improvement using final-test dynamic part average testing
W Dobbelaere, R Vanhooren, W De Man… - 2016 IEEE …, 2016 - ieeexplore.ieee.org
The growing number of chips in automotive applications has created an increasing urge to
avoid electronic failures in the field. Part Average Testing (PAT) is a generally used …
avoid electronic failures in the field. Part Average Testing (PAT) is a generally used …
Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm
S Nakahara, K Higeta, M Kohno… - … (IEEE Cat. No …, 1999 - ieeexplore.ieee.org
This paper presents a built-in self-test (BIST) scheme, which consists of a flexible pattern
generator and a practical on-macro two-dimensional redundancy analyzer, for GHz …
generator and a practical on-macro two-dimensional redundancy analyzer, for GHz …
Reducing overprovision of triple modular reduncancy owing to approximate computing
Until recently, Approximate Computing (AxC) was considered to be a trend topic mainly for
resilient applications. Its use aimed at reducing area and power consumption of Integrated …
resilient applications. Its use aimed at reducing area and power consumption of Integrated …
An SRAM weak cell fault model and a DFT technique with a programmable detection threshold
SRAM cell stability has become an important design and test issue owing to significant
process spreads, non-ideal operational conditions, and subtle manufacturing defects in …
process spreads, non-ideal operational conditions, and subtle manufacturing defects in …
[图书][B] Design and test of embedded SRAMs
AS Pavlov - 2005 - collectionscanada.gc.ca
Embedded SRAMs can occupy the majority of the chip area in SoCs. The increased process
spreads of modern scaled-down technologies and non-catastrophic defect-related sensitivity …
spreads of modern scaled-down technologies and non-catastrophic defect-related sensitivity …
Testing single via related defects in digital VLSI designs
N Mirabella, M Ricci, I Calà, R Lanza… - Microelectronics …, 2021 - Elsevier
In integrated circuit designs, the conductive connections between different layers are known
as vias or cuts. Such structures are critical for digital circuit manufacturing, as they represent …
as vias or cuts. Such structures are critical for digital circuit manufacturing, as they represent …
Test and reliability of approximate hardware
The undeniable need of energy efficiency in today's devices is leading to the adoption of
innovative computing paradigms—such as Approximate Computing. As this paradigm is …
innovative computing paradigms—such as Approximate Computing. As this paradigm is …
DefSim: A remote laboratory for studying physical defects in CMOS digital circuits
This paper describes a unique remote laboratory for studying CMOS physical defects that is
meant to be used in advanced courses in the scope of microelectronic design and test. Both …
meant to be used in advanced courses in the scope of microelectronic design and test. Both …