This survey presents an overview of recent advances in the state of the art for computer-
aided design (CAD) tools for analog and mixed-signal integrated circuits (ICs). Analog …

A pragmatic approach to testing electronic systems As we move ahead in the electronic age,
rapid changes in technology pose an ever-increasing number of challenges in testing …

The growing number of chips in automotive applications has created an increasing urge to
avoid electronic failures in the field. Part Average Testing (PAT) is a generally used …

This paper presents a built-in self-test (BIST) scheme, which consists of a flexible pattern
generator and a practical on-macro two-dimensional redundancy analyzer, for GHz …

Until recently, Approximate Computing (AxC) was considered to be a trend topic mainly for
resilient applications. Its use aimed at reducing area and power consumption of Integrated …

SRAM cell stability has become an important design and test issue owing to significant
process spreads, non-ideal operational conditions, and subtle manufacturing defects in …

Embedded SRAMs can occupy the majority of the chip area in SoCs. The increased process
spreads of modern scaled-down technologies and non-catastrophic defect-related sensitivity …

In integrated circuit designs, the conductive connections between different layers are known
as vias or cuts. Such structures are critical for digital circuit manufacturing, as they represent …

The undeniable need of energy efficiency in today's devices is leading to the adoption of
innovative computing paradigms—such as Approximate Computing. As this paradigm is …

This paper describes a unique remote laboratory for studying CMOS physical defects that is
meant to be used in advanced courses in the scope of microelectronic design and test. Both …