Device Modeling Bias in ReRAM-based Neural Network Simulations

O Yousuf, I Hossen, MW Daniels… - IEEE Journal on …, 2023 - ieeexplore.ieee.org
Emerging technologies based on resistive switching (ReRAM) devices promise to improve
the speed and energy efficiency of next generation machine learning accelerators, but …

Layer Ensemble Averaging for Improving Memristor-Based Artificial Neural Network Performance

O Yousuf, B Hoskins, K Ramu, M Fream… - arXiv preprint arXiv …, 2024 - arxiv.org
Artificial neural networks have advanced due to scaling dimensions, but conventional
computing faces inefficiency due to the von Neumann bottleneck. In-memory computation …

Neural Network Modeling Bias for Hafnia-based FeFETs

O Yousuf, I Hossen, A Glasmann, S Najmaei… - Proceedings of the 18th …, 2023 - dl.acm.org
Modeling bias–the difference between the test accuracy obtained by a reference network
prototype and a simulated model of that prototype–is explored in the context of hafnia-based …